IGEP0040TestsProtosRA

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VALIDATION OF PROTOTYPES

TBD

ISSUES AND IMPROVEMENTS

IGEP0040-RA01 version - Hynix memory

TBD

IGEP0040-RA02 version - Samsung memory

IGEP0040-RA03 version - Micron memory

Firsts test applied to 1 hand labeled board:

  • Visual mount inspection --> OK
  • Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
  • Overall consumption: 5V@0.21A ---> OK
  • Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)

RA0x common

TBD

TESTS UTILS

JTAG

TBD

Serial debug

TBD

...

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