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| − | Back to [[IGEP0040]] main project page
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| − | == VALIDATION OF PROTOTYPES ==
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| − | TBD
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| − | == ISSUES AND IMPROVEMENTS ==
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| − | === IGEP0040-RA01 version - Hynix memory ===
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| − | TBD
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| − | === IGEP0040-RA02 version - Samsung memory ===
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| − | === IGEP0040-RA03 version - Micron memory ===
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| − | Firsts test applied to 1 hand labeled board:
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| − | * Visual mount inspection --> OK
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| − | * Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
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| − | * Overall consumption: 5V@0.21A ---> OK
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| − | * Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)
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| − | === RA0x common ===
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| − | TBD
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| − | == TESTS UTILS ==
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| − | === JTAG ===
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| − | TBD
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| − | === Serial debug ===
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| − | TBD
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| − | ...
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