Revision as of 14:16, 5 November 2010

( WIP )

How to find the Silicon Revision of your OMAP35x

Read back a 32 bit word from the CONTROL_IDCODE Register at address: 0x4830 A204

Use the memory dump capability of u-boot

U-Boot # md 0x4830A204 1 
4830a204: 2b7ae02f    /.z+

from the read back value: 2b7ae02f, you can see the revision of this OMAP35x corresponds to ES2.1

or linux userspace utility devmem2 (http://www.lartmaker.nl/lartware/port/devmem2.c)

# devmem2 0x4830A204
/dev/mem opened.
Memory mapped at address 0x402cc000.
Value at address 0x4830A204 (0x402cc204): 0x4B7AE02F

from the read back value: 0x4B7AE02F, you can see the revision of this OMAP35x corresponds to ES3.1

Power consumption

Power measurements taken over the operating conditions specified.

Power measurements conditions:

• 1: Typical value when power-up with empty flash

MMC

I/O operations

#001 : Basic read/write operation

Category: performance

Description:

How to test:

The read tests were performed by running the following command:

$ time dd if=/dev/mmcblk0 of=/dev/null

The write tests were performed by running the following command:

$ time dd if=/dev/zero of=/dev/mmcblk0

The time used for the calculations was the time reported by dd.

Results:

OneNAND

MTD Test Suite

We assume that the mtd4 is available for test.

#001 : Simple read/write test

Category: functional

Description:

How to test:

Run the nandtest command

nandtest -l 4194304 -k -p 5 /dev/mtd4

Result should be like this:

ECC corrections: 0
ECC failures   : 0
Bad blocks     : 0
BBT blocks     : 0
003c0000: checking...
Finished pass 1 successfully
003c0000: checking...
Finished pass 2 successfully
003c0000: checking...
Finished pass 3 successfully
003c0000: checking...
Finished pass 4 successfully
003c0000: checking...
Finished pass 5 successfully

#002 : MTD suite test

Category: functional

Description: The MTD subsystem includes a set of tests which you may run to verify your flash hardware and drivers.

How to test:

Run this script

#!/bin/sh
#
#  mtd-test-suite
#
# The MTD subsystem includes a set of tests which you may run to verify your
# flash hardware and drivers. The tests are available in the drivers/mtd/tests
# directory of the linux kernel source codes. You may compile the tests as
# kernel modules by enabling them in the kernel configuration menu by marking:
# "Memory Technology Device (MTD) support" -> "MTD tests support"
# (or the MTD_TESTS symbol in the .config file).
#
# The MTD test-suite contains the following tests:
#   * mtd_speedtest: measures and reports read/write/erase speed of the MTD
#                    device.
#   * mtd_stresstest: performs random read/write/erase operations and validates
#         the MTD device I/O capabilities.
#   * mtd_readtest: this tests reads whole MTD device, one NAND page at a time
#         including OOB (or 512 bytes at a time in case of flashes like NOR) and
#         checks that reading works properly.
#   * mtd_pagetest: relevant only for NAND flashes, tests NAND page writing and
#         reading in different sizes and order; this test was originally
#         developed for testing the OneNAND driver, so it might be a little
#         OneNAND-oriented, but must work on any NAND flash.
#    * mtd_oobtest: relevant only for NAND flashes, tests that the OOB area I/O
#         works properly by writing data to different offsets and verifying it.
#    * mtd_subpagetest: relevant only for NAND flashes, tests sub-page I/O.
#    * mtd_torturetest: this test is designed to wear out flash eraseblocks. It
#         repeatedly writes and erases the same group of eraseblocks until an
#         I/O error happens, so be careful! The test supports a number of
#         options (see modinfo mtd_torturetest) which allow you to set the
#         amount of eraseblocks to torture and how the torturing is done. You
#         may limit the amount of torturing cycles using the cycles_count module
#         parameter. It may be very god idea to run this test for some time and
#         validate your flash driver and HW, providing you have a spare device.
#         For example, we caught rather rare and nasty DMA issues on an OMAP2
#         board with OneNAND flash, just by running this tests for few hours.
#    * mtd_nandecctest: a simple test that checks correctess of the built-in
#         software ECC for 256 and 512-byte buffers; this test is not
#         driver-specific but tests general NAND support code. (NOT APPLICABLE)
#
#  We assume that the mtd4 is available for test.

MTD=4
MTD_TESTS="mtd_oobtest mtd_pagetest mtd_readtest mtd_speedtest mtd_stresstest mtd_subpagetest mtd_torturetest"

# Assure all mtd test modules are removed
modprobe -r ${MTD_TESTS}

# Run test suite
for test in ${MTD_TESTS}; do
	case "$test" in
		"mtd_torturetest" )
		# clean the kernel ring buffer
		dmesg -c > /dev/null
		echo "MTD subsystem $test ..."
		modprobe ${test} dev=${MTD} cycles_count=1
		# print out the messages
		dmesg
		;;

		* )
		# clean the kernel ring buffer
		dmesg -c > /dev/null
		echo "MTD subsystem $test ..."
		modprobe ${test} dev=${MTD}
		# print out the messages
		dmesg
		;;
	esac
done

# Remove all mtd test modules
modprobe -r ${MTD_TESTS}

exit 0