IGEP0040TestsProtosRA

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Revision as of 18:01, 6 August 2015 by Pau (talk | contribs) (Homemade JTAG black stone / JTAGB connector)

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VALIDATION OF PROTOTYPES

Document: TBD

IGEP0040-RA03 version - Micron memory

Firsts test applied to 1 hand labeled board:

  • Visual mount inspection --> OK
  • Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
  • Overall consumption: 5V@0.21A ---> OK
  • Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)

Homemade JTAG black stone / JTAGB connector

Signal Name igep0040: JTAGB pos Black Stone pos
V_1P8 1 1&2
RESET_OUT 2 NC
RESET_IN_N2 3 15
UART3_TXD0 4 NC
UART3_RXD0 5 NC
PRI_TRST_N 6 3
PRI_TMS 7 7
PRI_TCK 8 9
PRI_TDI 9 5
PRI_TDO 10 13
GND 11 4

NOTE: Use PU (10K) from V_1P8 to: PRI_TRST_N, PRI_TDI and PRI_TCK and PRI_TMS

ISSUES AND IMPROVEMENTS

IGEP0040-RA01 version - Hynix memory

TBD

IGEP0040-RA02 version - Samsung memory

RA0x common

TBD

TESTS UTILS

JTAG

TBD

Serial debug

TBD

...