IGEP0040TestsProtosRA

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VALIDATION OF PROTOTYPES

TBD

ISSUES AND IMPROVEMENTS

IGEP0040-RA01 version - Hynix memory

TBD

IGEP0040-RA02 version - Samsung memory

IGEP0040-RA03 version - Micron memory

TBD

RA0x common

TBD

TESTS UTILS

JTAG

TBD

Serial debug

TBD

...

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