IGEP0040TestsProtosRA
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Contents
VALIDATION OF PROTOTYPES
TBD
ISSUES AND IMPROVEMENTS
IGEP0040-RA01 version - Hynix memory
TBD
IGEP0040-RA02 version - Samsung memory
IGEP0040-RA03 version - Micron memory
Firsts test applied to 1 hand labeled board:
- Visual mount inspection --> OK
- Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
- Overall consumption: 5V@0.21A ---> OK
- Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)
RA0x common
TBD
TESTS UTILS
JTAG
TBD
Serial debug
TBD
...