Difference between revisions of "IGEP0040TestsProtosRA"
From IGEP - ISEE Wiki
m |
m (→Homemade JTAG black stone / JTAGB connector) |
||
| Line 19: | Line 19: | ||
|- | |- | ||
| '''Signal Name''' | | '''Signal Name''' | ||
| − | | '''JTAGB pos''' | + | | '''igep0040: JTAGB pos''' |
| '''Black Stone pos''' | | '''Black Stone pos''' | ||
|- | |- | ||
| Line 66: | Line 66: | ||
| 4 | | 4 | ||
|} | |} | ||
| + | |||
| + | '''NOTE:''' Use PU (10K) from V_1P8 to: PRI_TRST_N, PRI_TDI and PRI_TCK and PRI_TMS | ||
== ISSUES AND IMPROVEMENTS == | == ISSUES AND IMPROVEMENTS == | ||
Revision as of 18:01, 6 August 2015
Back to IGEP0040 main project page
Contents
VALIDATION OF PROTOTYPES
Document: TBD
IGEP0040-RA03 version - Micron memory
Firsts test applied to 1 hand labeled board:
- Visual mount inspection --> OK
- Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
- Overall consumption: 5V@0.21A ---> OK
- Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)
Homemade JTAG black stone / JTAGB connector
| Signal Name | igep0040: JTAGB pos | Black Stone pos |
| V_1P8 | 1 | 1&2 |
| RESET_OUT | 2 | NC |
| RESET_IN_N2 | 3 | 15 |
| UART3_TXD0 | 4 | NC |
| UART3_RXD0 | 5 | NC |
| PRI_TRST_N | 6 | 3 |
| PRI_TMS | 7 | 7 |
| PRI_TCK | 8 | 9 |
| PRI_TDI | 9 | 5 |
| PRI_TDO | 10 | 13 |
| GND | 11 | 4 |
NOTE: Use PU (10K) from V_1P8 to: PRI_TRST_N, PRI_TDI and PRI_TCK and PRI_TMS
ISSUES AND IMPROVEMENTS
IGEP0040-RA01 version - Hynix memory
TBD
IGEP0040-RA02 version - Samsung memory
RA0x common
TBD
TESTS UTILS
JTAG
TBD
Serial debug
TBD
...
