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IGEP0040TestsProtosRA

1,547 bytes removed, 18:57, 6 August 2015
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== VALIDATION OF PROTOTYPES ==
 
Document: TBD
 
=== IGEP0040-RA03 version - Micron memory ===
 
Firsts test applied to 1 hand labeled board:
* Visual mount inspection --> OK
* Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
* Overall consumption: 5V@0.21A ---> OK
* Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)
* Test 25 MHz crystal --> add R950 (OK)
* Test power pin decoupling --> OK
* Add PU (4K7) to PRI_TRST into board. The others PU has been added to converter --> OK
* Umount all POWER bad resistors --> OK
* Add 330 nF to 3V3 enable LDO to delay 3_3P3 power source (RC: 10K/330nF) ---> OK
* Add 0R to R75 and R80 ---> OK
 
=== Homemade JTAG black stone / JTAGB connector ===
 
{| align="JUSTIFY" cellpadding="1" border="1" style="width: 300px; height: 1px;"
|-
| '''Signal Name'''
| '''igep0040: JTAGB pos'''
| '''Black Stone pos'''
|-
| V_1P8
| 1
| 1&2
|-
| RESET_OUT
| 2
| NC
|-
| RESET_IN_N2
| 3
| 15
|-
| UART3_TXD0
| 4
| NC
|-
| UART3_RXD0
| 5
| NC
|-
| PRI_TRST_N
| 6
| 3
|-
| PRI_TMS
| 7
| 7
|-
| PRI_TCK
| 8
| 9
|-
| PRI_TDI
| 9
| 5
|-
| PRI_TDO
| 10
| 13
|-
| GND
| 11
| 4
|}
 
'''NOTE:''' Use PU (10K) from V_1P8 to: PRI_TRST_N, PRI_TDI and PRI_TCK and PRI_TMS
 
== ISSUES AND IMPROVEMENTS ==
 
=== IGEP0040-RA01 version - Hynix memory ===
 
TBD
 
=== IGEP0040-RA02 version - Samsung memory ===
 
=== RA0x common ===
 
TBD
 
== TESTS UTILS ==
 
=== JTAG ===
 
TBD
 
=== Serial debug ===
 
TBD
 
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