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IGEP0040TestsProtosRA

669 bytes removed, 18:57, 6 August 2015
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== VALIDATION OF PROTOTYPES ==
 
TBD
 
== ISSUES AND IMPROVEMENTS ==
 
=== IGEP0040-RA01 version - Hynix memory ===
 
TBD
 
=== IGEP0040-RA02 version - Samsung memory ===
 
=== IGEP0040-RA03 version - Micron memory ===
 
Firsts test applied to 1 hand labeled board:
* Visual mount inspection --> OK
* Check main sources: 5V; 1V8 (WIFI clean); VDDQ; VTT; 1V2; 2V; 1V8 (V_1P8); 3V3 (V_3P3); VCC_MAIN --> OK
* Overall consumption: 5V@0.21A ---> OK
* Removed Standalone Marvell debug flex connector ---> Broken some NC pads from footprint (OK)
 
=== RA0x common ===
 
TBD
 
== TESTS UTILS ==
 
=== JTAG ===
 
TBD
 
=== Serial debug ===
 
TBD
 
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